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New Fluke Thermal Imagers Transform Market With Best-In-Class Focus and World-Renowned Ruggedness
04/16/2012 | 1663
Fluke Corporation introduces five new infrared cameras with a broad range of powerful yet easy-to-use capabilities.

New 4 GHz oscilloscope from Rohde & Schwarz delivers highest precision and acquisition rate in its class
04/11/2012 | 1967
Rohde & Schwarz continues to systematically broaden its oscilloscope portfolio, adding a 4 GHz model to its R&S RTO high-performance oscilloscope family. Together, the new R&S RTO1044 and the R&S RT-ZD40 differential probe (4.5 GHz bandwidth) are a powerful solution for developing digital, analog and RF designs.

Agilent Technologies Announces the Industry's First High-Speed AXIe Digitizer for Large-Scale Applied Physics
04/09/2012 | 1920
Agilent Technologies Inc. introduced the high-speed M9703A digitizer, the industry's first eight-channel, 12-bit digitizer that complies with the AXIe open standard. The AXIe digitizer is designed for use in large-scale applied physics applications.

Tektronix Delivers Thunderbolt™ Technology Test Solution
04/04/2012 | 1722
Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced a comprehensive test solution for Thunderbolt technology. Thunderbolt is a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements.

Keithley Introduces High Voltage System SourceMeter® Instrument optimized for High Power Semiconductor Test
03/28/2012 | 1842
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter® family of high speed, precision source measurement units.

Agilent Technologies Introduces Precision Waveform Analyzer Module With Industry-Best Performance
03/16/2012 | 1838
Agilent Technologies Inc. recently introduced a precision waveform analyzer for engineers involved in design verification and validation of high-speed electrical communications systems and components.

Tektronix to Provide First Automated Test Solution for MHL CTS 1.2
03/12/2012 | 2030
Integrated physical and protocol layer testing offers faster debug, analysis and MHL CTS 1.2 compliance testing.

Tektronix Announces High-Speed Optical Testing Toolset for Ethernet Standards
02/29/2012 | 2032
New optical modules for DSA8300 digital signal analyzer support optical compliance test up to 100G. This complete solution eliminates the need for additional test equipment such as optical-to-electric converters.

New GPS Simulator for Manufacturing Test
02/27/2012 | 1854
Spectracom’s GSG-52 broadens the range GPS RF signal generators. Spectracom, a company of the Orolia Group and the leading provider of practical test solutions for GPS and GNSS devices and systems, has announced a new offering in its line of GPS constellation simulators.

Tektronix MDO4000 Named ACE Awards Finalist in the Test and Measurement Systems and Boards Category
02/22/2012 | 1934
World’s first mixed domain oscilloscope captures another prestigious industry award recognition.


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