Tektronix MDO4000 Named ACE Awards Finalist in the Test and Measurement Systems and Boards Category

02/22/2012

Tektronix, the world's leading manufacturer of oscilloscopes, announced its MDO4000 Mixed Domain Oscilloscope Series has been named a finalist in the EE Times and EDN 2012 UBM Electronics ACE Awards in the Test and Measurement Systems and Boards category. The awards program honors the people and companies behind the technologies and products that are changing the world of electronics.

Voting for the Ultimate Products takes place now through February 24, 2012. To vote, please go to the online ballot here. The winners will be announced at an awards ceremony on Tuesday, March 27 at The Fairmont San Jose, during DESIGN West, a new UBM Electronics conference and expo.

“We are excited and honored to be in the running for an EE Times and EDN ACE Award – a highly valued recognition for our industry,” said Roy Siegel, general manager, Oscilloscopes at Tektronix. “The Tektronix MDO4000 Series is the world’s first oscilloscope to enable engineers to capture time-correlated analog, digital and RF signals with a single instrument and see how the RF spectrum changes over time. This breakthrough capability enables engineers to solve complicated design issues quickly and efficiently.”

Introduced on August 30, 2011, the MDO4000 Series is tailored to meet the needs of the more than 60 percent of oscilloscope users who also use a spectrum analyzer to troubleshoot embedded designs with wireless functionality. As the first oscilloscope ever to integrate the functionality of a spectrum analyzer, the MDO4000 provides a unique toolset which can save days or even weeks of debug time.

With the MDO4000, engineers can replace both a scope and spectrum analyzer with a single instrument. This enables them to continue using their tool of choice, the oscilloscope, to look at the frequency domain rather than having to find and relearn a spectrum analyzer. For debugging, it goes well beyond typical spectrum analyzer functionality by allowing users to capture time-correlated analog, digital and RF signals across 4 analog, 16 digital and 1 RF channel. With separate instruments, it is virtually impossible to accurately correlate signals across domains. This enables a new realm of testing, simplifying common debug tasks for today’s integrated wireless-enabled designs. For instance, now engineers can easily measure how long it takes their RF power amplifier to turn-on after a command is sent on the device’s serial bus.

“The new ACE Awards program, presented for the first time by both EE Times and EDN, provides us with an opportunity to recognize the technologies that have made a difference in the way we work, live and play over the past year. We congratulate the finalists on their innovations and leadership in the electronics industry. Additionally, we look forward to our awards ceremony in March to celebrate the innovation, creativity and contributions of the engineering community,” said Junko Yoshida, Editor in Chief, EE Times, UBM Electronics.

A panel of EE Times editors narrowed down the entries to five finalists in each category, based on the criteria set forth in an online submission form. Winners are determined from among the finalists by a panel of independent judges, including Robin B. Gray, Jr., Electronic Components Industry Association; Gordon Bell, Senior Researcher, Microsoft Research; Jeff Bier, President, Berkeley Design Technology, Inc. (BDTI), Founder, Embedded Vision Alliance; Larry Boucher, President and CEO, Alacritech; William Dally, Chairman, Computer Science Dept., Stanford University; Erach Desai, Consultant, DESAIsive; John East, President and CEO, Actel Corporation; Gene A. Frantz, Principal Fellow, Texas Instruments, Inc.; Lucio Lanza, Managing Director, Lanzatech Ventures; John Mashey, Consultant, Techviser; Dennis Monticelli, Chief Technoligist and Fellow, National Semiconductor; Martin Reynolds, Dataquest; George M. Scalise, President, Semiconductor Industry Association; Naveed Sherwani, President & CEO, Open Silicon; and Nick Tredennick, Editor, Gilder Technology Report. Judging took place from November 1, 2011-January 6, 2012.

For more information on the awards program visit http://ubm-ace.com/.

Tektronix, www.tektronix.com.