Yokogawa Test & Measurement Corporation Releases the AQ6150B and AQ6151B Optical Wavelength Meters

Yokogawa Test & Measurement Corporation Releases the AQ6150B and AQ6151B Optical Wavelength Meters

03/08/2019

Yokogawa Test & Measurement Corporation announces that it has developed the AQ6150B and AQ6151B optical wavelength meters. Thanks to their superior speed and accuracy, these new AQ6150 series instruments offer greatly improved measurement efficiency.

Development Background
The rapid spread of the Internet, smartphones, terrestrial digital broadcasting, and other communications services and devices requires the transmission of vast volumes of data at ever-increasing speeds. This is accelerating the expansion of core networks (backbone) and metro networks (local area) as well as the construction of data centers. In line with these trends, the production of optical transmission systems and various optical devices that make up these systems is being ramped up, spurring the market demand for precise yet efficient optical wavelength meters. In addition, fixed wavelength optical sources are being replaced by tunable optical sources as they become more compact and affordable. Therefore, precise optical wavelength meters that can accurately measure signals of various wavelengths are required.

The AQ6150B and AQ6151B optical wavelength meters are successors to the AQ6150 and the AQ6151, which were released to the market in 2012. With their top-class speed and accuracy, these new optical wavelength meters will enable a great improvement in measurement efficiency.

Product Features

1. Top-class speed and accuracy
The AQ6150B and AQ6151B are both among the fastest optical wavelength meters on the market today. They are able to measure, analyze, and transfer data in under 0.2 seconds, which is two times faster than the AQ6150 and the AQ6151. This will greatly improve throughput in applications such as the manufacturing of tunable optical sources, where several hundred measurements must be made for the adjustment and inspection of each device. The AQ6150B achieves a wavelength accuracy of ±0.7 ppm, the AQ6151B ±0.2 ppm. Both models are able to simultaneously measure up to 1,024 different wavelengths, best in the industry.

2. Wavelength ranges suited for a variety of needs
For both the AQ6150B and AQ6151B, there is a standard range type (1270 to 1650 nm), an extended range type (1200 to 1700 nm) for use in CWDM*1 transmission device manufacturing, and a wide range type (900 to 1700 nm) for use in the manufacturing of pump laser diodes for optical amplification. This lineup meets a variety of customer needs.

3. Inexpensive single-wavelength type / reduced lifecycle cost
The automatic inspection of laser wafers and laser semiconductor chips, which emit light with a single wavelength, is done at high speeds using a single wavelength. For such applications, the AQ6150B and AQ6151B also have a single-wavelength type that costs less than the multi-wavelength types. The total cost of ownership for all types of the two models is reduced thanks to the use of a long-life built-in reference optical source*2 and the provision of a low-cost replacement service.

Read more.

www.yokogawa.com



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