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Anritsu Introduces ShockLine™ VNA Solutions to Lower Test Costs Associated with Verifying E-band, Microwave Passive Component Performance12/25/2015 Anritsu Company introduces an E-band option for its ShockLine™ MS46500B series of 2- and 4-port performance Vector Network Analyzers (VNAs) that addresses the market need to lower cost-of-test for E-band components. With the option installed, the MS46500B series can reduce production costs and more efficiently verify the performance of high-frequency passive components, such as antennas, filters, and duplexers, during manufacturing. In addition to the E-band frequency capability, Anritsu also introduces 20 GHz and 40 GHz options for the ShockLine MS46500B series. With these options, the MS46500B VNAs address the S-parameter and time-domain measurement requirements associated with microwave applications. Cost-effective E-band Solution
Microwave Options
The 2-port MS46522B and 4-port MS46524B VNAs use the same software, command syntax, drivers, and programming environments as the other ShockLine instruments. This powerful feature enables reuse of program code written for ShockLine family VNAs on the E-band and microwave instruments with little or no alteration. ShockLine software also provides a powerful graphical user interface (GUI) for manual test environments. When attached to a user-supplied touchscreen monitor, the full-featured GUI provides comprehensive capabilities, including network extraction, embedding/de-embedding networks, and time domain with gating. Developing and troubleshooting test programs is made easier with advanced marker functionality, limit lines, and other features of the software. The ShockLine MS46500B VNA series has best-in-class dynamic range of 140 dB at 2 GHz and typically >120 dB up to 40 GHz, as well as fast sweep times and industry-best maximum output power, all at an economical price. It is one of five ShockLine series that feature 1-, 2-, or 4-port models in multiple form factors. All ShockLine VNAs are designed with LAN or USB interfaces to fit any testing environment and can economically test passive devices in cost-sensitive manufacturing, engineering, and education applications. |
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