Rohde & Schwarz presents most compact RF test solution for LTE-Advanced carrier aggregation with MIMO

11/15/2013

The new solution enables chipset manufacturers and developers of wireless devices to check their hardware’s RF performance. It is possible to carry out physical layer tests and data rate tests. Users can verify whether the receiver correctly acquires the LTE-Advanced signal from the two component carriers. For end-to-end testing, measurements can also be made in the data application mode in order to assess the wireless device’s overall performance. Options for fading tests on both component carriers are in the pipeline.

The options for LTE-Advanced downlink carrier aggregation, R&S CMW-KS502 for LTE FDD and R&S CMW-KS552 for LTE TDD, are now available from Rohde & Schwarz. Existing R&S CMW500 test platforms can be retrofitted. Rohde & Schwarz also offers options for LTE-Advanced downlink carrier aggregation test scenarios for the R&S CMW500 protocol tester.

Rohde & Schwarz, www.rohde-schwarz.com