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Tektronix Announces Interoperability with AWS Media Services
03/06/2018 | 1002
Tektronix, an industry-leading innovator of video test, monitoring and diagnostics solutions, has announced interoperability with its video quality assurance solutions and Amazon Web Services (AWS) Elemental MediaLive, AWS Elemental MediaConvert, and AWS Elemental MediaPackage. The combination gives video providers, including pay TV operators, broadcasters and OTT providers, a scalable and cost-effective means to convert and package video content into various formats, while ensuring quality across the video workflow from acquisition to delivery.

NI and Shanghai University Collaborate on a 5G Ultra-Reliable Low-Latency Testbed for V2X Communications
03/02/2018 | 1083
National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced plans to collaborate with Shanghai University on a testbed focused on 5G ultra-reliable low-latency communications (URLLC) for V2X applications.

Highly integrated, wide voltage input synchronous converters feature industry-leading EMI and thermal performance
02/27/2018 | 946
Texas Instruments (TI) introduced two families of wide-VIN synchronous DC/DC buck regulators with industry-leading electromagnetic interference (EMI) and thermal performance.

Rohde & Schwarz presents the first moveable over-the-air test chamber for 5G antennas and transceivers
02/23/2018 | 1080
The new R&S ATS1000 antenna test chamber from Rohde & Schwarz allows developers and production engineers to perform over-the-air (OTA) measurements for 5G on their antenna modules, transceivers, chipsets and wireless devices. Antenna and transceiver measurements are possible in the frequency range from 18 GHz to 87 GHz. The system therefore supports all millimeter-wave frequency bands currently considered for 5G. The compact test chamber makes it possible to measure mobile devices in the far field.

Tektronix Accelerates EMI/EMC Compliance Testing
02/20/2018 | 960
Tektronix, a leading worldwide provider of measurement solutions, introduced EMCVu, a new all-in-one solution for EMI/EMC pre-compliance testing and troubleshooting. In today's electronic design environment, about 50 percent of products fail electromagnetic compatibility (EMC) testing the first time. EMCVu gives engineers an accurate, convenient and cost-effective approach to determine if their product designs will pass EMC emission compliance testing on the first try.

Keysight Technologies Receives Certification for eCall Test Emulator Software
02/16/2018 | 1093
Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers, and governments accelerate innovation to connect and secure the world, announced that the Keysight E6951A public safety answering point (PSAP) emulator has been certified by NavCert GmbH. The E6951A is part of Keysight’s E6950A eCall Conformance Test Solution. The certification was awarded Dec. 18, 2017.

Test Smarter With the Latest Enhancements to LabVIEW NXG
02/13/2018 | 1058
National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a new release of LabVIEW NXG, the next generation of LabVIEW engineering system design software. Engineers can now test smarter with LabVIEW NXG - quickly set up your instruments, customize tests to your device specifications, and easily view results from any web browser, on any device.

Germany’s broadcaster RTL II relies on monitoring and multiviewer solution from Rohde & Schwarz
02/06/2018 | 1330
Pioneering German broadcaster, RTL II, has selected Rohde & Schwarz to provide state-of-the-art AV content monitoring and multiviewer facilities for its revolutionary new totally IP-based OTT playout.

Keysight Technologies' New Third-Generation Parametric Test Solution Reduces Time-To-Market, Lowers Cost-Of-Test
01/30/2018 | 1146
Keysight Technologies, Inc. announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically increasing.

Tektronix Instruments Support First Data Transmission Through Terahertz Multiplexer
01/26/2018 | 1155
Tektronix, a leading worldwide provider of measurement solutions, announced that its instruments played an important role in a technology demonstration that could one day enable the next generation of ultra-high bandwidth wireless communications links. In an article published in the journal Nature Communications, an international research team reported the first transmission of two real-time video signals through a terahertz multiplexer at an aggregate data rate of 50 gigabits per second, some100x faster than cellular networks.


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