Industry news

National Instruments, the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated measurement systems, announced two series of new millimeter wave (mmWave) radio heads for the mmWave Transceiver System. The new radio heads, which cover spectrum from 24.5 GHz to 33.4 GHz and 37 GHz to 43.5 GHz, are targeted at wireless researchers prototyping 5G New Radio (NR) systems.

Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced the addition of IQFlowTM functionality to its RSA7100A wideband signal analysis solution. This enhancement delivers the speed and flexibility needed to perform real-time digital signal processing (DSP) and support hardware in the loop (HWIL or HIL) test for radar and electronic warfare (EW) systems.

Texas Instruments announced the addition of new microcontrollers (MCUs) with integrated signal-chain elements and an extended operating temperature range to its MSP430™ value line portfolio. New MSP430FR2355 ferroelectric random access memory (FRAM) MCUs allow developers to reduce printed circuit board (PCB) size and bill-of-materials (BOM) cost while meeting temperature requirements for sensing and measurement in applications such as smoke detectors, sensor transmitters and circuit breakers.

Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers, and governments accelerate innovation to connect and secure the world has expanded the company's handheld field measurement solutions with the new Nemo IoT Meter and Nemo Handy IoT solutions. These solutions enable network operators and service providers to actively test networks in the field, ensuring the coverage and service quality of networks in mission-critical and consumer-based Internet of Things (IoT) applications, accelerating installations, and speeding time-to-revenue.

Rohde & Schwarz offers market-leading test coverage for the certification of eMTC and NB-IoT devices and components. Test cases are validated for test platforms with the R&S CMW500 wideband radio communication tester and the R&S TS8980FTA and R&S TS-RRM conformance test systems.

NI, the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated measurement systems, announced NI-RFmx NB-IoT/eMTC measurement software, which complements NI’s existing RF test capabilities for wireless technologies ranging from 802.11a/b/g/n/ac/ax to Bluetooth to 2G/3G/4G/5G standards.

Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers, and governments accelerate innovation to connect and secure the world, announced that the company is extending its collaboration with MediaTek, Inc. to accelerate 5G New Radio (NR) chipset development and testing of 5G NR protocol stacks.

Anritsu Company introduces the industry’s first solution capable of conducting extensive characterization of the differential noise figure of differential devices used in high-speed wireless communication systems. The solution, which integrates a new differential noise figure option into the Anritsu VectorStar™ vector network analyzers (VNAs), allows R&D engineers to verify the receiver performance of low noise amplifiers (LNAs) and other devices used in the front-end of 5G and microwave back haul systems.

Rohde & Schwarz, a leading supplier of test & measurement equipment, has further expanded the capabilities of its R&S CMW500 wideband radio communication tester and R&S SMBV100A GNSS simulator to support Global Certification Forum (GCF) protocol conformance tests for C-V2X device certification. Utilizing the Qualcomm® 9150 C-V2X chipset solution from Qualcomm Technologies, Inc., a subsidiary of Qualcomm Incorporated, the R&S CMW500 acting as LTE network simulator now allows automakers to test C-V2X direct communications (PC5) according to GCF Work Item 281.

Texas Instruments (TI) introduced three new amplifiers with a unique combination of high speed and high precision, allowing designers to create more accurate circuits for error-sensitive applications. The new devices support more precise measurement and faster processing of a wide variety of input signals in test and measurement, medical, and data-acquisition systems.

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