Industry news

National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. Designed for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a fast, flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.

A new high-end network analyzer from Rohde & Schwarz strengthens the company’s position in the network analysis segment of the test and measurement market. The R&S ZVA110 covers the entire frequency range from 10 MHz to 110 GHz.

In his message to customers Joseph P Keithley (President and Chief Executive Officer, Keithley Instruments, Inc.) informed about sales agreement whereby Tektronix will purchase Keithley. The acquisition was announced on September 29, 2010, and is expected to be completed by the end of 2010. The message is published at www.keithley.com/message

Yokogawa Electric Corporation announced the launch of the FVX110 Fieldbus Segment Indicator on September 30. This new product conforms to the FOUNDATION™ fieldbus industrial digital communications standard.

Danaher Corporation and Keithley Instruments, Inc. announced that they have entered into a definitive merger agreement pursuant to which Danaher will acquire all of the outstanding Common Shares and Class B Common Shares of Keithley at a purchase price of $21.60 per share in cash for an enterprise value of approximately $300 million net of cash to be assumed. The acquisition has been unanimously approved by the Keithley Board of Directors.

Tektronix, Inc., announced the AWG7000C and AWG5000C Series of Arbitrary Waveform Generators (AWGs) that bring performance and usability enhancements to the industry’s most capable family of signal generation solutions. The new “C” series of Tektronix AWG instruments provide a 45 percent reduction in waveform creation times compared to prior AWG instruments, essential for performance-intensive applications where large number of waveforms are required to effectively characterize high-speed serial and wideband RF/Microwave designs.

Rohde & Schwarz presents its T&M solutions at electronica 2010 under the motto "Frequency meets Time": Its new oscilloscopes have advanced the company into the time domain. The R&S RTO and R&S RTM families are a highlight at the Rohde & Schwarz booth 307 in hall A1. One of the other top products on exhibit is the R&S FSVR, the world's first real-time spectrum analyzer up to 30 GHz. But that's not all: Rohde & Schwarz showcases new innovations in the microwave and millimeter-wave T&M portfolio with signal generation up to 110 GHz.

Agilent Technologies expanded its test and measurement portfolio into the modular domain with the introduction of 46 new PXI and AXIe products. The new products bring Agilent's measurement expertise - including advanced measurement software and high-performance hardware - to the modular form factor. These products also will enable new capabilities that were not previously available across analog, digital, RF, microwave and lightwave test technologies.

Tektronix, the market leader in broadcast video test, monitoring and analysis solutions, announced that it has obtained Type Approval Certificates in Russia for several of its compressed and uncompressed video test solutions.

Agilent Technologies Inc. (NYSE: A) today introduced new, thematic skins for the U1240 and U1250 Series handheld digital multimeters (DMMs). The new skins allow engineers and technicians to personalize their DMMs, which are used to perform everyday measurements and troubleshooting tasks.

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