Industry news

The Fluke engineering team has developed a new IR Window specifically for indoor applications built on the tried and trusted technology of the existing outdoor CLKT line.

The new R&S SMZ frequency multiplier family provides convenient microwave measurement capabilities in the 50 GHz to 110 GHz range. The frequency multipliers in the R&S SMZ family are the first on the market to offer users the choice of either mechanically or electronically controlled built-in attenuator options.

Fluke is introducing the return of the world’s most advanced Power Quality Clamp Meter. The Fluke 345 has been re-designed due to the discontinuation of some major components. The instrument performance specification of the replacement product remains the same as the previous version. For the user the product is functionally identical, the item number stays the same as do the items shipped with the product.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were recently awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties.

Agilent Technologies Inc. introduced a Tektronix-to-Agilent probe adapter. The N2744A T2A adapter enables engineers to connect Tektronix TekProbe-BNC Level 2 probes to Agilent's Infiniium and InfiniiVision oscilloscopes.

The TDS2000C series of oscilloscopes offers performance gains, more models, more automated measurements, adds datalogging and limit test features.

Chengdu fab puts manufacturing close to growing customer base in China. The fab is a fully equipped 200mm manufacturing facility and was purchased from Cension Semiconductor Manufacturing Company.

The world’s leading companies in the area of embedded hardware and software will meet at electronica 2010, the number 1 international trade fair for components, systems and applications in the electrical and electronics industry, from November 9 to 12, 2010. electronica 2010 will feature the latest generation of microprocessors, boards, development platforms and test software.

National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. Designed for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a fast, flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.

A new high-end network analyzer from Rohde & Schwarz strengthens the company’s position in the network analysis segment of the test and measurement market. The R&S ZVA110 covers the entire frequency range from 10 MHz to 110 GHz.

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