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Agilent Technologies Introduces Measurement Applications for its Low-Cost Signal Analyzer
12/22/2010 | 2259
The measurement applications address cellular communications, wireless networking and digital video standards, allowing CXA, a low-cost signal analyzer, to provide a comprehensive list of measurement applications

NI LabWindows™/CVI 2010 Improves ANSI C Developer Productivity and Simplifies FPGA Communication
12/20/2010 | 2418
National Instruments announced the release of new version of NI LabWindows/CVI 2010. New version simplifies test system development for Linux, real-time and FPGA-based systems

Agilent Technologies introduces next-generation vector signal analysis software
12/15/2010 | 2413
The new 89600B software provides R&D engineers performing signal and modulation analysis with a window into what's happening inside their complex wireless devices. The 89600B VSA software measures more than 70 signal standards and modulation types covering a range of applications (e.g., mobile communications, wireless connectivity, military communications, satellite communications, and more)

Keithley’s free technical online seminar on Bias Temperature Instability and State of the Art Measurement Methods
12/13/2010 | 2093
Keithley Instruments invites to take part in free technical online seminar “Fundamentals of BTI Bias Temperature Instability and State of the Art Measurement Methods” on Thursday, December 16, 2010.

Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User Equipment
12/09/2010 | 2253
The PXT test set is designed for RF characterization, protocol verification and end-to-end application testing of LTE user equipment (UE). This new instrument transforms LTE device verification by minimizing design uncertainty and reducing lab setup time, while maximizing performance and scalability.

Tektronix Introduces New Oscilloscope Platform with Breakthrough Performance
12/07/2010 | 2567
New MSO/DPO5000 Series, Enhancements to MSO/DPO4000 Series and new high-bandwidth passive probes give embedded designers more performance and analysis.

Agilent Technologies' new option for RF and microwave signal generators offers industry's lowest close-in, pedestal phase noise
12/03/2010 | 2268
Agilent Technologies introduced new option for its PSG family of RF and microwave signal generators.
The new option reduces close-in phase noise by 5 dB and pedestal phase noise by 12 dB. Option UNY is ideal for R&D and test engineers working on defense electronics and wireless communication systems.

Keithley Instruments hosts applications Forum to encourage idea exchange, discussions among users
11/29/2010 | 2470
Keithley Instruments, Inc. is hosting a forum designed to offer customers and users of Keithley instrumentation a central location for finding product support and exchanging applications insights via the web.

Agilent Technologies Introduces Wide-Bandwidth Oscilloscope for Faster, More Accurate Characterization of High-Speed Digital Designs
11/26/2010 | 2167
Agilent Technologies Inc. expanded its digital communications analyzer (DCA) portfolio with the introduction of the 86100D DCA-X wide-bandwidth oscilloscope. The DCA-X provides engineers with the tools needed to characterize their high-speed digital designs easily and accurately.

Agilent Technologies Begins Unveiling ADS 2011 for Multi-Technology Design
11/23/2010 | 2889
Agilent Technologies Inc. announced it has begun unveiling the highly anticipated next release of its Advanced Design System (ADS) flagship RF design software. ADS 2011 delivers breakthrough capabilities for multi-technology design inherent in today's RF System-in-Package (SiP) components.


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