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Industry news
04/06/2011 | 1989
Two new high-performance microwave modules are designed to meet the demanding signal integrity and performance requirements of RF test equipment, ideal for transmitter/receiver systems. Modules are available "Off-the-shelf" or tailored to customer specifications.
03/29/2011 | 2181
Agilent Technologies announced a new release of its 3-D electromagnetic modeling and simulation platform Electromagnetic Professional 2011.02 for creating 3-D models and analyzing the electrical performance of packages, connectors, antennas, and other RF components. EMPro 2011.02 delivers new meshing technologies for both its time- and frequency domain electromagnetic solvers.
03/24/2011 | 2145
New 80C14 module for Tektronix DSA8200 Digital Serial Analyzer adds to the industry’s most comprehensive test support for high-speed optical networking.
03/21/2011 | 2233
National Instruments announced two new products that extend the communication and measurement capabilities of the NI wireless sensor network (WSN) platform.
03/18/2011 | 2116
During the conference on power electronics, Tektronix introduced two new models of passive voltage probes of TPP series, enabling the development of more energy efficient power supplies and power semiconductors designs.
03/15/2011 | 2150
Yokogawa Meters & Instruments Corporation released the AQ1200B and AQ1200C multi field testers. These two new models in the AQ1200 OTDR series are designed for use in the maintenance of fiber-optic telecommunications networks.
03/10/2011 | 2045
Agilent Technologies Inc. extended its leadership in LTE test with the introduction of dedicated LTE-Advanced signal generation and signal analysis solutions. A number of new technologies are being introduced into LTE-Advanced to enable peak data rates of up to 1 Gbps in the downlink and 500 Mbps in the uplink.
03/04/2011 | 2052
New instrument delivers the bandwidth, speed and accuracy to simulate real-world radar, satellite and electronic warfare test scenarios. With up to 14 bits of resolution, the M8190A makes it easy for designers to distinguish between signals and distortion in their test scenarios and stress their devices more rigorously.
03/01/2011 | 2048
The new 3.6 GHz RF vector signal analyzer NI PXIe-5665 features industry-leading phase noise, average noise level, amplitude accuracy and dynamic range.
02/25/2011 | 2452
Agilent Technologies Inc. announced new functional test features for its E6621A PXT wireless communications test set. Used in conjunction with Agilent's popular E5515C 8960 wireless communications test set, the PXT now supports handover between different radio access technologies (RAT).
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