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NI DIAdem 2011 Expedites Analysis, Reporting of Engineering Measurement Data
07/18/2011 | 2094
Latest version features include flexible load behavior for large data sets, DataPlugin Wizard for Microsoft Excel and fundamental enhancements to DIAdem REPORT.

New applications for R&S®ZVH4 / R&S®ZVH8 handheld cable and antenna analyzer
07/14/2011 | 3024
The R&S®ZVH-K42 vector network analysis application and R&S®ZVH-K45 vector voltmeter measurement application add vector network analysis measurement capabilities and a vector voltmeter to the R&S®ZVH4 / R&S®ZVH8 handheld cable and antenna analyzers.

Tektronix Acquires Veridae Systems, Inc.
07/11/2011 | 2119
Tektronix, Inc., a leading supplier of test, measurement, and monitoring products and solutions, announced the acquisition of Veridae Systems, Inc. Acquired company is known for delivering three leading products for ASIC/FPGA prototyping debug, ASIC post silicon validation and FPGA-based system product validation into leading semiconductor and system product companies.

Agilent Technologies Introduces New 8990B Peak Power Analyzer with the Fastest Rise Time/Fall Time in the Peak Power-Measurement Market
07/07/2011 | 2105
Agilent Technologies Inc. (NYSE: A) announced the Agilent 8990B, a peak power analyzer that offers faster measurement speed and greater measurement accuracy in peak power-pulse analysis for the aerospace, defense and wireless markets.

Fluke presents new P3 Series Thermal Imagers
07/01/2011 | 2157
The all new Fluke P3 Series thermal imagers provides high-performance for any budget. Based on the award-winning Fluke Ti32 & TiR32, the Fluke Ti27, TiR27, Ti29 & TiR29 deliver proven, practical performance for a wide range of diagnostic applications and designed to work in even the harshest environments providing superior image quality with a one-handed, easy-to-use interfaces.

Join Keithley’s Webinar on Understanding Electrical Characterization of Solar Cells
06/28/2011 | 2059
Keithley Instruments invites to join for a webcast seminar and discuss the different measurement techniques that can be used to characterize solar cells and other photovoltaic devices. The seminar will run at Thursday, June 30, 2011.

World First 28-Gbit/s Interconnect Signal Integrity Analysis
06/23/2011 | 2182
Anritsu launch MU181500B Jitter Modulation Sources and MP1825B 4 Tap Emphasis. Two new product releases upgrades allows the MP1800A to support jitter tolerance testing and emphasis signal generation for quality inspection of parts and circuit boards supporting 28-Gbit/s interconnects.

Rohde & Schwarz R&S®FSH4 / R&S®FSH8 handheld spectrum analyzers measure 3GPP WCDMA BTS/Node B code domain power
06/20/2011 | 2856
The new R&S®FSH-K44E measurement application makes R&S®FSH4/R&S®FSH8 handheld spectrum analyzers ready for 3GPP WCDMA BTS/Node B code domain power measurements.

NI Expands FPGA-Enabled NI FlexRIO Family for PXI With Six New I/O Modules
06/15/2011 | 2445
National Instruments new group of adapter modules includes four general-purpose digitizers, a module for high-speed digital I/O and the industry’s fastest 16-bit analog-to-digital converter (ADC) from Analog Devices, Inc. (ADI), which is optimized for modulated communications.

Anritsu Expands Analysis Capability of LMR Master With Introduction of WiMAX Options
06/13/2011 | 1911
Digital modulation measurement capabilities of S412E now include both Fixed and Mobile WiMAX to address LMR system backhaul applications.


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