Industry news

World’s first mixed domain oscilloscope combines scope and spectrum analyzer functionality in a single instrument – providing time correlated analog, digital and RF signals.

With R&S BCDRIVE, broadcast transmitter operators can now also measure network coverage with drive tests. This solution even enables them to determine network coverage in parallel for multiple broadcasting channels, which significantly reduces measurement times.

National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor. The new VSA features industry-leading phase noise and dynamic range, regardless of form factor, including traditional rack-and-stack instruments.

J1512A Passive Probe for BERTWave Series allows engineers to more efficiently verify designs of high-speed digital communications equipment and devices.

Products expand the NI RIO Advanced Control and Monitoring Platform with higher-performance and smaller form factor targets.

Combination of Optametra and Tektronix creates best-in-class analysis and performance to address emerging coherent optical standards.

DPO/DSA70000D Series provides 100 GS/s sampling rate on 2 channels supporting today’s fastest signals for optical modulation analysis and SerDes validation.

Agilent Technologies Inc. (NYSE: A) announced the addition of two new application-specific modules to the N6700 Modular Power System (MPS) family, the N6783A-MFG mobile communications DC power module and the N6783A-BAT battery charge/discharge module.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.

Agilent Technologies Inc. (NYSE: A) introduced five new PNA microwave vector network analyzer models, up to 67 GHz. The new PNA Series is based on Agilent's PNA-X architecture and is used to test a wide variety of passive and active devices such as filters, duplexers, amplifiers and frequency converters.

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