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Spectracom Assures GPS Integrity with Leap Second Testing Tools
02/17/2012 | 1963
GPS simulators offer fast and easy testing of the upcoming leap second event on June 30 to validate performance of GPS devices and systems.

Anritsu Introduces In-Line Peak Power Sensor
12/07/2011 | 2011
Anritsu Company introduces the MA24105A, a standalone, compact, and highly accurate in-line peak power sensor that provides a wide range of power measurement capability over a frequency range of 350 MHz to 4 GHz.

Analog Devices’ Signal Processing Technology Helps CERN’s Large Hadron Collider Achieve Highest Possible Superconducting Magnet Performance
11/17/2011 | 2044
The European Organization for Nuclear Research (CERN) in Switzerland and the University of Sannio, Benevento, Italy, have collaborated on the design of an advanced instrument for measuring magnetic fields in CERN’s Large Hadron Collider (LHC) superconducting magnets. Called the Fast Digital Integrator (FDI) board, this measurement device uses Analog Devices’ A/D converters, analog multiplexers and DSP components to provide the LHC with the highest possible performance achieved to-date in measuring magnetic fields.

Agilent Technologies' New Wireless Link Analysis Software Accelerates Troubleshooting with Greater Visibility into Messaging between Devices
11/07/2011 | 2248
Agilent Technologies Inc. introduced its 89600 WLA software, a MAC-layer complement to the company's industry-leading 89600 VSA software. The key benefit is the ability to view and interpret RF activity and measurements-retransmissions, power, modulation format, timing and so on-in a MAC-message context, and to also view and interpret MAC messages in an RF context.

National Instruments Releases LabVIEW Toolkit for Machine Prognostics and Health Management
11/03/2011 | 2180
National Instruments introduced the Watchdog Agent Prognostics Toolkit for NI LabVIEW system design software, which expands the capabilities of LabVIEW in machine prognostics and health management (PHM) applications.

Agilent Technologies Introduces First Complete and Compliant 60-GHz Wireless Test Solution with M8190A Arbitrary Waveform Generator
11/01/2011 | 3240
Agilent Technologies Inc. announced the first complete and compliant test solution for 60-GHz wireless devices, including WiGig, WirelessHD and IEEE 802.11ad devices. Agilent's compliant solutions cover the lifecycle for mmWave devices from system-level design to verification testing.

Advantest U3841, U3851 and U3872 cross domain spectrum analyzers expand Rohde & Schwarz portfolio
10/28/2011 | 2152
The Advantest spectrum analyzers offer a variety of applications, including propagation measurements, electromagnetic field radiation, interference monitoring and measurements, satellite signal monitoring and phased array antenna measurements.

Agilent Technologies' Frequency Converter Measurement Solution Simplifies Test by Eliminating Reference and Calibration Mixers
10/24/2011 | 2157
Agilent Technologies Inc. introduced a frequency converter measurement capability for its PNA and PNA-X Series network analyzers. With this capability, engineers now have a quicker, easier way to fully characterize mixers and frequency converters up to 67 GHz.

productronica 2011 with top-class supporting programme
10/14/2011 | 2695
productronica, the world’s leading trade fair for innovative electronics production, will be offering an extensive supporting programme in the New Munich Trade Fair Centre from November 15 - 18. 2011. Representatives from business, science and research will be providing an extensive insight in the forums and the new Speaker’s Corner into cutting-edge technologies and innovations, developments and trends.

Keithley Launches New General Purpose Programmable Power Supply Product Line
10/10/2011 | 1954
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced the availability of five new general-purpose programmable DC power supplies designed to complement the company's existing line of specialty power supplies and source measurement instruments for component, module, and device characterization and test applications.


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