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Agilent Technologies Provides New Level of Realism in Testing and Evaluation of Advanced Radar and Electronic-Warfare Systems
09/19/2011 | 1991
Agilent Technologies Inc. (NYSE: A) announced a range of cutting-edge capabilities that enable economical testing and evaluation of advanced radar and electronic-warfare (EW) systems. Spanning signal-creation software, signal generators, measurement applications and signal analyzers, the additions enable test solutions that provide greater flexibility and cost-effectiveness than typical single-purpose EW threat simulators.

Anritsu Company Expands LTE Measurement Capabilities in Spectrum Master™ and BTS Master™ Handheld Analyzers
09/15/2011 | 1788
New LTE analysis tools help field engineers and technicians install, commission, and maintain LTE networks.

Yokogawa Releases ISA100.11a-based YTMX580 Multi-input Temperature Transmitter
09/12/2011 | 2130
Yokogawa Electric Corporation announces release of the YTMX580 multi-input temperature transmitter to the market. The YTMX580 is based on the ISA100.11a industrial automation wireless communication standard and features an industry-leading eight analog input channels.

Agilent Technologies' New Vector Network Analyzer Delivers Enhanced Capability, Cost-Effective RF Network Analysis
09/07/2011 | 2041
Agilent Technologies Inc. (NYSE: A) introduced the newest member of its popular ENA Series of network analyzers, the E5072A vector network analyzer. Available as either a two-port, 30-kHz to 4.5-GHz or 8.5-GHz instrument, the E5072A offers improved performance over current RF network analyzers, enhanced functionality, a configurable test set, and a wide output power level for full characterization of devices.

NI Modules Expand PXI Platform Capability, Reduce Cost for Semiconductor Characterization and Test
09/02/2011 | 2038
Digital per-pin parametric measurement and high-density source measure unit modules ideal for semiconductor. The NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

Tektronix Breaks Innovation Barrier and Delivers Transformational New Oscilloscope Category
08/30/2011 | 2202
World’s first mixed domain oscilloscope combines scope and spectrum analyzer functionality in a single instrument – providing time correlated analog, digital and RF signals.

Rohde & Schwarz enhances TV analyzer with drive test software that tests multiple channels and antenna options
08/18/2011 | 2159
With R&S BCDRIVE, broadcast transmitter operators can now also measure network coverage with drive tests. This solution even enables them to determine network coverage in parallel for multiple broadcasting channels, which significantly reduces measurement times.

National Instruments Extends Leading PXI RF Test Performance to 14 GHz
08/15/2011 | 1992
National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor. The new VSA features industry-leading phase noise and dynamic range, regardless of form factor, including traditional rack-and-stack instruments.

Anritsu Introduces High-Frequency Sampling Oscilloscope Probe
08/12/2011 | 1867
J1512A Passive Probe for BERTWave Series allows engineers to more efficiently verify designs of high-speed digital communications equipment and devices.

National Instruments Announces First Multicore CompactRIO With Intel® Core™ i7 Processor and Smallest NI Single-Board RIO Devices
08/08/2011 | 2158
Products expand the NI RIO Advanced Control and Monitoring Platform with higher-performance and smaller form factor targets.


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