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![]() 07/25/2011 | 1935
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.
![]() 07/21/2011 | 1962
Agilent Technologies Inc. (NYSE: A) introduced five new PNA microwave vector network analyzer models, up to 67 GHz. The new PNA Series is based on Agilent's PNA-X architecture and is used to test a wide variety of passive and active devices such as filters, duplexers, amplifiers and frequency converters.
![]() 07/18/2011 | 2049
Latest version features include flexible load behavior for large data sets, DataPlugin Wizard for Microsoft Excel and fundamental enhancements to DIAdem REPORT.
![]() 07/14/2011 | 2986
The R&S®ZVH-K42 vector network analysis application and R&S®ZVH-K45 vector voltmeter measurement application add vector network analysis measurement capabilities and a vector voltmeter to the R&S®ZVH4 / R&S®ZVH8 handheld cable and antenna analyzers.
![]() 07/11/2011 | 2092
Tektronix, Inc., a leading supplier of test, measurement, and monitoring products and solutions, announced the acquisition of Veridae Systems, Inc. Acquired company is known for delivering three leading products for ASIC/FPGA prototyping debug, ASIC post silicon validation and FPGA-based system product validation into leading semiconductor and system product companies.
![]() 07/07/2011 | 2078
Agilent Technologies Inc. (NYSE: A) announced the Agilent 8990B, a peak power analyzer that offers faster measurement speed and greater measurement accuracy in peak power-pulse analysis for the aerospace, defense and wireless markets.
![]() 07/01/2011 | 2102
The all new Fluke P3 Series thermal imagers provides high-performance for any budget. Based on the award-winning Fluke Ti32 & TiR32, the Fluke Ti27, TiR27, Ti29 & TiR29 deliver proven, practical performance for a wide range of diagnostic applications and designed to work in even the harshest environments providing superior image quality with a one-handed, easy-to-use interfaces.
![]() 06/28/2011 | 1981
Keithley Instruments invites to join for a webcast seminar and discuss the different measurement techniques that can be used to characterize solar cells and other photovoltaic devices. The seminar will run at Thursday, June 30, 2011.
![]() 06/23/2011 | 2150
Anritsu launch MU181500B Jitter Modulation Sources and MP1825B 4 Tap Emphasis. Two new product releases upgrades allows the MP1800A to support jitter tolerance testing and emphasis signal generation for quality inspection of parts and circuit boards supporting 28-Gbit/s interconnects.
![]() 06/20/2011 | 2815
The new R&S®FSH-K44E measurement application makes R&S®FSH4/R&S®FSH8 handheld spectrum analyzers ready for 3GPP WCDMA BTS/Node B code domain power measurements.
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