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09/11/2013 | 1425
Cal-Bay Systems is a leader in comprehensive, automated test and measurement processes based on NI technology platforms. Recently, we have teamed with Lawrence Berkeley National Laboratory (LBNL) to provide test, validation, and measurement equipment for the US Department of Energy’s new Facility for Low Energy Experiments in Buildings, or FLEXLAB. The facility will provide researchers, manufacturers, developers, architects, engineers, contractors, and utilities the tools to accurately field-test innovations in green building technologies and controls.
![]() 09/04/2013 | 1505
Agilent Technologies Inc. (NYSE: A) and Tyndall National Institute at University College Cork officially opened a new laboratory for research and teaching in next-generation wireless communications. This state-of-the-art laboratory at Tyndall will enable advanced training and research on radio frequency integrated circuits for high-speed wireless data communications for video applications and contactless sensors for biomedical and security applications.
![]() 09/02/2013 | 1513
The new R&S BTC broadcast test center from Rohde & Schwarz provides a complete testing environment for nearly all audio, video and multimedia applications – in a single device. The RF reference signal generator generates RF signals for all global TV and broadcasting standards and simulates transmissions. The generator can also internally analyze the audio/video functions of DUTs in realtime. The modular design provides a high degree of scalability, allowing the R&S BTC to be configured for any customer requirement.
![]() 08/28/2013 | 1416
Highly efficient, three-phase motor control expertise, once only obtainable to a niche market of motor designers, is now available to a wider audience of developers. Texas Instruments (TI) (NASDAQ: TXN) brings its revolutionary InstaSPIN-FOC™ (field-oriented-control) sensorless motor control technology to its most affordable, real-time-control C2000™ Piccolo™ F2802x microcontrollers (MCUs) series, offering a smaller package size and much lower cost.
![]() 08/26/2013 | 1534
The new Keithley Model 2450 Touchscreen Source Measure Unit (SMU) Instrument is ideal for I-V functional test and characterization of a wide range of today's modern electronic devices, including scaled semiconductors, nano-scale devices and materials, organic /printed electronics and other current and voltage testing applications.
![]() 08/21/2013 | 1677
Agilent Technologies Inc. (NYSE: A) announced the availability of scanning microwave microscopy (SMM) capabilities for its premier-performance atomic force microscope, the 5500 AFM. Agilent's second-generation SMM nose cone makes this unique electrical measurement option compatible with the 5500 system.
![]() 08/19/2013 | 1373
Building upon its robust embedded processing software and tools ecosystem, Texas Instruments (TI) (NASDAQ: TXN) announced a new class of JTAG emulator, the XDS200 for $295. This new emulator can be utilized for hardware debugging, algorithm development and programming on TI’s embedded processors. Providing a great balance of cost and performance, the XDS200 emulator fits in the overall TI emulator portfolio between the entry-level XDS100 JTAG emulator and the XDS560v2 JTAG emulator with system trace receiver. XDS200 JTAG emulators support a USB connection to the host computer and work with 32- and 64-bit versions of Microsoft Windows and Linux operating systems.
![]() 08/14/2013 | 1664
Rohde & Schwarz has expanded its successful R&S ESR family by adding a model for up to 26.5 GHz. This means that high measurement speeds and comprehensive diagnostic tools are now also available for EMC certification testing in line with the FCC standard and measurements in line with military standards.
![]() 08/12/2013 | 1444
The new NI cRIO-9068 software-designed controller is part of the most advanced and open system design platform for embedded control and monitoring systems.
![]() 08/07/2013 | 1385
Agilent Technologies Inc. (NYSE: A) announced the industry's first MIPITM M-PHY physical layer receiver and transmitter tests with switch automation. The tests are designed to accelerate the turn-on and debug of MIPI M-PHY-based systems and to provide design engineers an efficient way to ensure their M-PHY devices will interoperate with the application processor.
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