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![]() 07/31/2015 | 1322
Keysight Technologies, Inc. expanded its PAM-4 measurement solutions with support for PAM-4 data formats and built-in error counters on the M8000 Series BER test solutions. PAM-4 support and the ability to integrate a device's built-in error counter helps R&D and test engineers characterize and test high-speed digital receivers for the data-center networking, storage and computer industries.
![]() 07/28/2015 | 1293
The 21st annual NIWeek conference presented by NI begins August 3 in Austin, Texas, and once again brings together the brightest minds in engineering and science.
![]() 07/24/2015 | 1106
Anritsu Corporation announces the launch of its new MP1861A MUX and MP1862A DEMUX modules for the MP1800A Signal Quality Analyzer. This will expand the functions of the MP1800A 32G BERT to support 56G and 64G BER measurements required for evaluating high-speed serial transmission devices, such as SERDES. When used in conjunction with the MP1800A, the two new modules support a generation of NRZ Data and BER measurements up to 64.2 Gbit/s. In addition, the support for Jitter Tolerance and Bathtub Jitter measurements meets the recommendations of the latest CEI-56G and 400GbE standards.
![]() 07/17/2015 | 1384
The R&S FSW85 from Rohde & Schwarz is the company's latest addition to its successful family of high-end signal and spectrum analyzers. It is ideal for demanding research and development applications. Thanks to its easy handling, the R&S FSW85 simplifies complex measurement tasks in the fields of automotive radar, 5G and other wireless communications standards or aerospace and defense.
![]() 07/09/2015 | 1238
Keysight Technologies, Inc. introduced a BGA (ball grid array) interposer solution for testing DDR4 x16 DRAM (dynamic random access memory) designs with a logic analyzer. Using the Keysight W4636A DDR4 x16 BGA interposer solution, engineers can quickly and accurately capture address and command signals, and a subset of data signals, for debugging designs and performing functional validation measurements for data rates up to 2,400 Mb/s.
![]() 07/02/2015 | 1250
Texas Instruments introduced the industry's first magnetic sensing integrated circuit (IC) with a fully integrated fluxgate sensor and compensation coil driver, along with all the required signal conditioning circuitry. Complete integration enables the DRV421 to provide best-in-class sensor accuracy and linearity, high dynamic range, and simpler system design compared to traditional closed-loop sensors. With the DRV421, system designers will be able to more easily develop magnetic closed-loop current sensors for applications such as motor control, renewable energy, battery chargers and power monitoring.
![]() 06/29/2015 | 1102
Anritsu Corporation announces the launch of MT8821C, the new Radio Communication Analyzer for research and development testing of mobile devices (User Equipment, UE) with the widest capability for supporting LTE-Advanced.
![]() 06/25/2015 | 1433
The new phase noise analyzer and VCO tester from Rohde & Schwarz enables ultrasensitive and ultra-fast phase noise measurements. The R&S FSWP also allows users to very easily measure pulsed sources and residual phase noise of RF components. Plus the instrument can be upgraded to a signal and spectrum analyzer.
![]() 06/22/2015 | 1131
Keysight Technologies, Inc. introduced a full line-up of current-voltage (I-V) analyzers for characterizing a wide range of nanomaterials and electronic devices. Referred to collectively as the Precision Current-Voltage Analyzer Series, the analyzers deliver best-in-class accuracy and performance, powerful analysis features, and support for cutting-edge applications.
![]() 06/17/2015 | 1151
Texas Instruments introduced the first power management chipset with intelligent digital control and a unique body-diode sensing feature to optimize secondary-side synchronous rectification in next-generation AC/DC and isolated DC/DC power supplies. The UCD3138A digital controller and UCD7138 low-side gate driver improve system efficiency and cut synchronous rectification MOSFET voltage stress in half compared to other digital-power solutions.
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