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Nobel Winners in Physics Used Keithley Instrumentation in Prize-Winning Research
11/01/2010 | 2171
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were recently awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties.

Agilent Technologies Introduces Tektronix-to-Agilent Probe Adapter, Expands Oscilloscope Value
10/29/2010 | 2533
Agilent Technologies Inc. introduced a Tektronix-to-Agilent probe adapter. The N2744A T2A adapter enables engineers to connect Tektronix TekProbe-BNC Level 2 probes to Agilent's Infiniium and InfiniiVision oscilloscopes.

Tektronix Enhances ‘World’s Most Popular Oscilloscope’ Series
10/26/2010 | 2369
The TDS2000C series of oscilloscopes offers performance gains, more models, more automated measurements, adds datalogging and limit test features.

Texas Instruments opens the company's first semiconductor manufacturing plant in China
10/22/2010 | 2069
Chengdu fab puts manufacturing close to growing customer base in China. The fab is a fully equipped 200mm manufacturing facility and was purchased from Cension Semiconductor Manufacturing Company.

Development and integration of embedded systems at electronica 2010
10/20/2010 | 2245
The world’s leading companies in the area of embedded hardware and software will meet at electronica 2010, the number 1 international trade fair for components, systems and applications in the electrical and electronics industry, from November 9 to 12, 2010. electronica 2010 will feature the latest generation of microprocessors, boards, development platforms and test software.

National Instruments to Add LTE Automated Test Capabilities to PXI RF Test Portfolio
10/19/2010 | 2386
National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. Designed for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a fast, flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.

New R&S ZVA110 network analyzer from Rohde & Schwarz handles gapless measurements from 10 MHz to 110 GHz
10/15/2010 | 2845
A new high-end network analyzer from Rohde & Schwarz strengthens the company’s position in the network analysis segment of the test and measurement market. The R&S ZVA110 covers the entire frequency range from 10 MHz to 110 GHz.

Keithley will be part of Danaher’s Tektronix business
10/13/2010 | 2492
In his message to customers Joseph P Keithley (President and Chief Executive Officer, Keithley Instruments, Inc.) informed about sales agreement whereby Tektronix will purchase Keithley. The acquisition was announced on September 29, 2010, and is expected to be completed by the end of 2010. The message is published at www.keithley.com/message

Yokogawa Launches FOUNDATION™ fieldbus Compliant FVX110 Fieldbus Segment Indicator
10/11/2010 | 2506
Yokogawa Electric Corporation announced the launch of the FVX110 Fieldbus Segment Indicator on September 30. This new product conforms to the FOUNDATION™ fieldbus industrial digital communications standard.

Danaher to acquire Keithley Instruments
10/05/2010 | 2554
Danaher Corporation and Keithley Instruments, Inc. announced that they have entered into a definitive merger agreement pursuant to which Danaher will acquire all of the outstanding Common Shares and Class B Common Shares of Keithley at a purchase price of $21.60 per share in cash for an enterprise value of approximately $300 million net of cash to be assumed. The acquisition has been unanimously approved by the Keithley Board of Directors.


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