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Tektronix Component Solutions Introduces Instrument-grade Microwave Modules
04/06/2011 | 2037
Two new high-performance microwave modules are designed to meet the demanding signal integrity and performance requirements of RF test equipment, ideal for transmitter/receiver systems. Modules are available "Off-the-shelf" or tailored to customer specifications.

Agilent Technologies' Latest 3-D EM Simulation Platform Provides Faster, More Accurate Modeling of RF, High-Speed Components
03/29/2011 | 2241
Agilent Technologies announced a new release of its 3-D electromagnetic modeling and simulation platform Electromagnetic Professional 2011.02 for creating 3-D models and analyzing the electrical performance of packages, connectors, antennas, and other RF components. EMPro 2011.02 delivers new meshing technologies for both its time- and frequency domain electromagnetic solvers.

Tektronix Adds Support for 16GFC Fibre Channel and 14 Gb/s FDR Infiniband Standards
03/24/2011 | 2224
New 80C14 module for Tektronix DSA8200 Digital Serial Analyzer adds to the industry’s most comprehensive test support for high-speed optical networking.

National Instruments Expands the NI Wireless Sensor Network Platform
03/21/2011 | 2282
National Instruments announced two new products that extend the communication and measurement capabilities of the NI wireless sensor network (WSN) platform.

Tektronix Unveiled New Probes at APEC 2011
03/18/2011 | 2170
During the conference on power electronics, Tektronix introduced two new models of passive voltage probes of TPP series, enabling the development of more energy efficient power supplies and power semiconductors designs.

Yokogawa Meters & Instruments Launches AQ1200B and AQ1200C Multi Field Testers for Maintenance Use
03/15/2011 | 2201
Yokogawa Meters & Instruments Corporation released the AQ1200B and AQ1200C multi field testers. These two new models in the AQ1200 OTDR series are designed for use in the maintenance of fiber-optic telecommunications networks.

Agilent Technologies Introduces Industry's First LTE-Advanced Signal Generation, Analysis Solutions
03/10/2011 | 2125
Agilent Technologies Inc. extended its leadership in LTE test with the introduction of dedicated LTE-Advanced signal generation and signal analysis solutions. A number of new technologies are being introduced into LTE-Advanced to enable peak data rates of up to 1 Gbps in the downlink and 500 Mbps in the uplink.

Agilent Technologies Introduces Groundbreaking Arbitrary Waveform Generator
03/04/2011 | 2134
New instrument delivers the bandwidth, speed and accuracy to simulate real-world radar, satellite and electronic warfare test scenarios. With up to 14 bits of resolution, the M8190A makes it easy for designers to distinguish between signals and distortion in their test scenarios and stress their devices more rigorously.

National Instruments Delivers Industry-Leading RF Performance in PXI Form Factor
03/01/2011 | 2112
The new 3.6 GHz RF vector signal analyzer NI PXIe-5665 features industry-leading phase noise, average noise level, amplitude accuracy and dynamic range.

Agilent Technologies' PXT Wireless Communications Test Set Now Supports Critical LTE Inter-RAT Handover
02/25/2011 | 2501
Agilent Technologies Inc. announced new functional test features for its E6621A PXT wireless communications test set. Used in conjunction with Agilent's popular E5515C 8960 wireless communications test set, the PXT now supports handover between different radio access technologies (RAT).


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