Industry news

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.

Agilent Technologies Inc. (NYSE: A) introduced five new PNA microwave vector network analyzer models, up to 67 GHz. The new PNA Series is based on Agilent's PNA-X architecture and is used to test a wide variety of passive and active devices such as filters, duplexers, amplifiers and frequency converters.

Latest version features include flexible load behavior for large data sets, DataPlugin Wizard for Microsoft Excel and fundamental enhancements to DIAdem REPORT.

The R&S®ZVH-K42 vector network analysis application and R&S®ZVH-K45 vector voltmeter measurement application add vector network analysis measurement capabilities and a vector voltmeter to the R&S®ZVH4 / R&S®ZVH8 handheld cable and antenna analyzers.

Tektronix, Inc., a leading supplier of test, measurement, and monitoring products and solutions, announced the acquisition of Veridae Systems, Inc. Acquired company is known for delivering three leading products for ASIC/FPGA prototyping debug, ASIC post silicon validation and FPGA-based system product validation into leading semiconductor and system product companies.

Agilent Technologies Inc. (NYSE: A) announced the Agilent 8990B, a peak power analyzer that offers faster measurement speed and greater measurement accuracy in peak power-pulse analysis for the aerospace, defense and wireless markets.

The all new Fluke P3 Series thermal imagers provides high-performance for any budget. Based on the award-winning Fluke Ti32 & TiR32, the Fluke Ti27, TiR27, Ti29 & TiR29 deliver proven, practical performance for a wide range of diagnostic applications and designed to work in even the harshest environments providing superior image quality with a one-handed, easy-to-use interfaces.

Keithley Instruments invites to join for a webcast seminar and discuss the different measurement techniques that can be used to characterize solar cells and other photovoltaic devices. The seminar will run at Thursday, June 30, 2011.

Anritsu launch MU181500B Jitter Modulation Sources and MP1825B 4 Tap Emphasis. Two new product releases upgrades allows the MP1800A to support jitter tolerance testing and emphasis signal generation for quality inspection of parts and circuit boards supporting 28-Gbit/s interconnects.

The new R&S®FSH-K44E measurement application makes R&S®FSH4/R&S®FSH8 handheld spectrum analyzers ready for 3GPP WCDMA BTS/Node B code domain power measurements.

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