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NI Expands SC Express PXI Sensor Measurement Family With New RTD Module
05/23/2012 | 1840
National Instruments announced the NI PXIe-4357 RTD module, the latest addition to its SC Express sensor measurement family for PXI Express. The high-performance module is optimized for temperature measurements with Pt100 RTD sensors for a variety of thermal monitoring applications.

Tektronix Enhances Optical Modulation Analysis Solution
05/21/2012 | 1668
Tektronix announced that its OM4000 Series Optical Modulation Analyzer can now drive the DSA8300 Digital Sampling Oscilloscope to perform analysis on PM-QPSK, QAM, and other complex-modulation signals with higher vertical resolution than real-time based solutions at lower total system cost.

Agilent Technologies Announces Shipment of the IC-CAP 2012 Platform for Device Characterization and Modeling
05/16/2012 | 1871
The new IC-CAP release radically changes the way data is stored, analyzed and selected for modeling tasks, greatly increasing workflow efficiency and ensuring continued data integrity and traceability.

Fluke 60 Series Handheld Infrared Thermometers
05/14/2012 | 1725
Fluke knows temperature, with more than two decades of thermometry experience. Today, the company offers the latest in non-contact IR temperature test tools, probes, accessories, and application expertise for a complete range of applications. And Fluke backs its tools with the industry’s best warranty and highest rated customer service.

Agilent Infiniium oscilloscope reaches 63-GHz-bandwidth
05/09/2012 | 2087
With two of its four channels active and the maximum 2 Gsamples/active channel acquisition-memory installed, Agilent's new Infiniium 96204Q real-time-sampling DSO takes 160 Gsamples/sec on each active channel and, at that sampling rate, captures records of 12.5-msec duration.

National Instruments Releases Wireless I/O for NI CompactRIO
05/07/2012 | 1729
National Instruments announced a new wireless gateway and two new measurement nodes that extend the capabilities of the NI wireless sensor network (WSN) platform and illustrate the company’s commitment to wireless measurement technology. With NI LabVIEW system design software, engineers can easily integrate wired and wireless measurement and control systems and deploy autonomous programs to WSN nodes that perform local control, data analysis and event-based alarming or notification.

Introducing the Yokogawa DTSX200 Distributed Temperature Sensor
05/02/2012 | 1965
The first distributed temperature sensor for oil/gas and industrial production operations developed by a production control system manufacturer.

Rohde & Schwarz is the first manufacturer to provide VAMOS test cases
04/30/2012 | 1803
VAMOS, which stands for voice services over adaptive multi-user channels on one slot, is an extension of GSM that has been specified in the 3GPP standard. VAMOS can double the voice channels of a GSM base station.

Agilent Technologies Introduces Industry's First Reference Clock Multiplier for Receiver Test
04/25/2012 | 1697
Agilent Technologies Inc. announced the industry's first reference clock multiplier. The Agilent N4880A reference clock multiplier enables R&D and test engineers to lock the pattern generator clock of the J-BERT N4903B and the ParBERT 81250A to reference clocks from the system under test.

Rohde & Schwarz adds WLAN signaling functions to its R&S CMW500 and R&S CMW270 multistandard test platforms
04/23/2012 | 2045
To achieve optimal results, WLAN user equipment needs to be tested under realistic operating conditions. The R&S CMW500 wideband radio communication tester and the R&S CMW270 wireless connectivity tester now have new options for accomplishing this task: In signaling mode, they can emulate a WLAN access point in line with IEEE 802.11a/b/g/n.


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