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![]() 09/15/2011 | 1767
New LTE analysis tools help field engineers and technicians install, commission, and maintain LTE networks.
![]() 09/12/2011 | 2110
Yokogawa Electric Corporation announces release of the YTMX580 multi-input temperature transmitter to the market. The YTMX580 is based on the ISA100.11a industrial automation wireless communication standard and features an industry-leading eight analog input channels.
![]() 09/07/2011 | 2004
Agilent Technologies Inc. (NYSE: A) introduced the newest member of its popular ENA Series of network analyzers, the E5072A vector network analyzer. Available as either a two-port, 30-kHz to 4.5-GHz or 8.5-GHz instrument, the E5072A offers improved performance over current RF network analyzers, enhanced functionality, a configurable test set, and a wide output power level for full characterization of devices.
![]() 09/02/2011 | 2015
Digital per-pin parametric measurement and high-density source measure unit modules ideal for semiconductor. The NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.
![]() 08/30/2011 | 2170
World’s first mixed domain oscilloscope combines scope and spectrum analyzer functionality in a single instrument – providing time correlated analog, digital and RF signals.
![]() 08/18/2011 | 2126
With R&S BCDRIVE, broadcast transmitter operators can now also measure network coverage with drive tests. This solution even enables them to determine network coverage in parallel for multiple broadcasting channels, which significantly reduces measurement times.
![]() 08/15/2011 | 1975
National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor. The new VSA features industry-leading phase noise and dynamic range, regardless of form factor, including traditional rack-and-stack instruments.
![]() 08/12/2011 | 1833
J1512A Passive Probe for BERTWave Series allows engineers to more efficiently verify designs of high-speed digital communications equipment and devices.
![]() 08/08/2011 | 2135
Products expand the NI RIO Advanced Control and Monitoring Platform with higher-performance and smaller form factor targets.
![]() 08/04/2011 | 2113
Combination of Optametra and Tektronix creates best-in-class analysis and performance to address emerging coherent optical standards.
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